Core Facility for Multidisciplinary Structural Analysis

The environmental scanning electron microscope (ESEM) stands out for its ability to observe specimens in their natural state, offering a unique perspective on surface structures and behaviors without the need for extensive sample preparation. Unlike traditional electron microscopes, the ESEM can operate under a range of environmental conditions, including high humidity and low vacuum, enabling the examination of delicate or hydrated samples without compromising their integrity. This versatility makes the ESEM an invaluable tool for studying biological specimens, polymers, and other materials sensitive to conventional electron microscopy techniques. Its capacity to provide high-resolution imaging coupled with in-situ observation capabilities makes the ESEM indispensable for research across numerous scientific disciplines, from materials science to biology and environmental studies.

Our in situ mechanical testing stage in combination with our ESEM offers a unique capability to observe material responses to stress in real time at microscopic levels. This device facilitates the direct visualization of structural changes, such as deformation, fracture, and phase transitions. Such detailed observations are invaluable for understanding material behavior and mechanisms at the micro and nano scales, crucial for the development of materials with superior properties and for investigating failure processes. The integration of mechanical testing with high-resolution imaging significantly enhances our ability to study and predict material performance, making it a key tool in fields like biomechanics, materials science, metallurgy, and nanotechnology.

A sputter coater, an essential component in electron microscopy sample preparation, plays a pivotal role in enhancing specimen conductivity and imaging quality. By employing a process known as sputtering, wherein atoms from a target material are dislodged by bombarding it with energetic ions, the sputter coater deposits a thin conductive layer onto the sample surface. This layer serves to minimize charging effects during imaging, thereby improving resolution and contrast in scanning electron microscopy (SEM) analysis. Additionally, the sputter-coated layer can enhance sample stability and reduce beam damage, particularly for non-conductive or fragile materials. With precise control over deposition parameters, such as coating thickness and material composition, the sputter coater accommodates a wide range of sample types and SEM applications. Its versatility and effectiveness make it an indispensable tool for researchers across disciplines, facilitating detailed examination and analysis of diverse specimens, from biological tissues to nanomaterials.

At the GZMS we use a state-of-the-art Leica ACE 600 system.

A critical point dryer (CPD) is renowned for its capability to gently remove solvents from delicate specimens, preserving their structural integrity during the drying process. Unlike conventional drying methods, which can cause distortion or damage to fragile samples, the CPD utilizes a combination of controlled pressure and temperature to reach the critical point of a solvent, where liquid and gas phases coexist. At this critical point, the solvent transitions directly into a gas without undergoing phase change, effectively avoiding surface tension-induced damage commonly associated with other drying techniques. This unique feature makes the CPD particularly well-suited for preparing biological samples, such as tissues or cells, as well as porous materials like ceramics or polymers, for subsequent analysis via microscopy or other analytical techniques. Its ability to provide artifact-free drying ensures accurate representation of sample morphology and composition, making the CPD an indispensable tool in various fields including materials science, biomedical research, and nanotechnology.

At the GZMS we use a state-of-the-art Leica EM CPD300 system.

The micro-computed tomography (micro-CT) scanner is a sophisticated imaging instrument renowned for its ability to produce high-resolution, three-dimensional representations of internal structures within a wide range of materials. Similar to medical CT scanners but on a much smaller scale, micro-CT utilizes X-ray technology to capture detailed cross-sectional images of specimens with micrometer-level precision. This non-destructive imaging technique allows for the visualization of internal features and spatial relationships without the need for physical sectioning or invasive procedures. From characterizing the internal morphology of biological tissues to analyzing the internal structure of engineered materials, micro-CT provides valuable insights into the microstructural properties of diverse samples. Its versatility, coupled with advanced image analysis capabilities, makes micro-CT an indispensable tool for researchers across disciplines, including materials science, biology, geology, and archaeology, facilitating a deeper understanding of complex systems and phenomena at the microscale.

At the GZMS we use a versatile Bruker Skyscan 1275 system.